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Week
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Topics
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Study Metarials
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1
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Thin Film Structure and Characterization Techniques
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R1- Chapter-1
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2
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UV-vis Spectrophotometer
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R6-Chapter-2
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3
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X-Ray Diffraction (XRD)
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R1-Chapter-3
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4
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Scanning Electron Microscope (SEM)
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R1-Chapter-10
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5
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Atomic Force Microscope (AFM)
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R3- Chapter-1
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6
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Scanning Tunneling Microscope (STM)
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R4-Chapter-1
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7
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Hall Effect Measurement
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R1-Chapter-15
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8
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Current-Voltage (I-V) Measurement
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R1-Chapter-15
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9
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Photoluminescence (PL)
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R1-Chapter-12
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10
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Raman Spectroscopy
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R2-Chapter-4
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11
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Spectroscopic Ellipsometry (SE)
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R2-Chapter-3
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12
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X-Ray Photoelectron Spectroscopy (XPS)
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R5-Chapter-1
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13
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Fourier Transform Infrared (FTIR) Spectroscopy
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R7-Chapter-1
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14
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Capacitance-Voltage (C-V) Measurement
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R1-Chapter-15
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